Abstract
Low-count imaging arises when limited illumination or dose yields only a few detected particles in microscopy, such as photons or electrons, causing measurements to be dominated by signal-dependent Poisson shot noise. Supervised denoisers typically require paired clean and noisy observations, whereas many self-supervised approaches exploit spatial or temporal redundancy without directly estimating the underlying particle-arrival process. We introduce PARM, a self-supervised denoising framework based on particle-arrival-rate matching. By modeling particle accumulation over exposure as a Poisson counting process, PARM identifies the conditional particle-arrival-rate field with the posterior mean of the latent clean rate. Poisson thinning then splits each observation into complementary lower-exposure views that provide self-supervised rate targets for one another. In implementation, the network estimates the normalized spatial allocation of the conditional rate, while the observed total count determines its global particle mass. Experiments on synthetic data, natural-video sequences corrupted with Poisson noise, and real low-dose electron microscopy demonstrate leading or competitive performance while effectively preserving fine structures. PARM therefore provides a statistically grounded approach to low-count image denoising when clean references are unavailable.
Abstract (translated)
URL
https://arxiv.org/abs/2610.33136
